000 00913nam a2200253Ia 4500
008 191130s2009##################000#0#eng##
020 _a9780819475657
022 _a2010459350
040 _aACL
_cACL
082 _a621.362 BUR
245 _aThermosense XXXI : 14-15 April 2009, Orlando, Florida, United States
_cDouglas D. Burleigh, Ralph B. Dinwiddie, editors ; sponsored and published by SPIE
260 _aBellingham, WA
_bSPIE
_c2009
300 _a1 v. (various pagings) : ill. ; 28 cm.
500 _aIncludes bibliographical references and author index
650 _aNondestructive testing - Congresses
650 _aThermography - Congresses
650 _aThermography - Industrial applications - Congresses
700 _aBurleigh, Douglas D
700 _aDinwiddie, Ralph B
710 _aSPIE (Society)
990 _af464ec01ac10000c4084d87a3a8054bd
991 _a382016
999 _c77847
_d77847