000 00929nam a22001937a 4500
005 20250725165556.0
008 250725b |||||||| |||| 00| 0 eng d
020 _a9780792382638
_qhbk
041 _aeng
082 _a005.14
_bSHE
100 _a Sheppard, W John.
245 _a Research Perspectives And Case Studies In System Test And Diagnosis
_c/John W. Sheppard, William Randolph Simpson
260 _a, Boston,
_b Kluwer Aacdemic Publishers
_c ©1998
300 _a xiv, 232 pages :
_b illustrations ;
_c25 cm.
504 _aindex
520 _aThe works included in this volume are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998. In this volume, a select group of workshop
650 _a Appareils Électroniques Essais Défauts Électriques Localisation Electric Fault Location Electronic Apparatus And Appliances Testing
942 _cENGLISH
999 _c577449
_d577449