000 | 00514nam a2200169 4500 | ||
---|---|---|---|
005 | 20250628183926.0 | ||
008 | 250628b |||||||| |||| 00| 0 eng d | ||
020 |
_a9781402077524 _qhbk |
||
041 | _aeng | ||
082 |
_a004.53 _bHAM |
||
245 |
_aTesting Static Random Access Memories _b: defects, fault models and test patterns _cSaid Hamdioui |
||
260 |
_aBoston _bKluwar Academic Publishers _c2004 |
||
300 |
_axx, 221 p. _c24 cm. |
||
504 | _aindex | ||
650 | _aRandom Access Memory Testing | ||
942 | _cREF | ||
999 |
_c574235 _d574235 |