000 00514nam a2200169 4500
005 20250628183926.0
008 250628b |||||||| |||| 00| 0 eng d
020 _a9781402077524
_qhbk
041 _aeng
082 _a004.53
_bHAM
245 _aTesting Static Random Access Memories
_b: defects, fault models and test patterns
_cSaid Hamdioui
260 _aBoston
_bKluwar Academic Publishers
_c2004
300 _axx, 221 p.
_c24 cm.
504 _aindex
650 _aRandom Access Memory Testing
942 _cREF
999 _c574235
_d574235