000			02099nam a2200217Ia 4500
008			240821s9999 xx 000 0 und d
020			_a9783030370886 _qhbk
041			_aeng
082			_a621.381 _bMEY
100			_aMeyer, Ernst
245		0	_aScanning Probe Microscopy, The Lab on A Tip _c/ Ernst Meyer, Hans J. Hug and Roland Bennewitz
250			_a2nd ed.
260			_bSpringer Nature _c2021 _aSwitzerland
300			_axiv, 322 p _b; ill. _c; 24 cm.
504			_aBib and Ref
520			_aWritten by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques in the field of nanoscience. This second edition includes essential scientific updates reflecting the latest research, as well as coverage of new breakthroughs in techniques such as submolecular imaging by atomic force microscopy (AFM), multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, and tip-enhanced Raman scattering. The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate students, either for self-study or as a textbook for a dedicated course on the topic. Furthermore, it is an essential component of any scanning probe microscopy laboratory course and a valuable resource for practicing researchers developing and using scanning probe techniques.
650			_aScanning probe microscopy
700			_aHug, Hans J.
700			_aBennewitz, Roland
942			_cENGLISH
999			_c524203 _d524203