| 000 | 00645nam a2200205Ia 4500 | ||
|---|---|---|---|
| 008 | 191130s1998##################000#0#eng## | ||
| 020 | _a824701828 | ||
| 022 | _a98002765 | ||
| 040 |
_aACL _cACL |
||
| 082 | _a621.3815 DAV | ||
| 100 | _aDavid, René | ||
| 245 |
_aRandom testing of digital circuits : theory and applications _cRené David |
||
| 260 |
_aNew York _bMarcel Dekker _c1998 |
||
| 300 | _axix, 475 p. : ill. ; 24 cm | ||
| 500 | _aIncludes bibliographical references (p. 447-461) and index | ||
| 650 | _aDigital integrated circuits - Testing | ||
| 990 | _a3347adafac10000c6b8bfd85457ffea9 | ||
| 991 | _a151698 | ||
| 999 |
_c49973 _d49973 |
||