| 000 | 00738nam a2200217Ia 4500 | ||
|---|---|---|---|
| 008 | 210417s9999 xx 000 0 und d | ||
| 020 |
_a9781781546239 _qhbk |
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| 041 | _aeng | ||
| 082 |
_a621.3 _bSUZ.3 |
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| 100 | _aSuzuki, Satoshi | ||
| 245 | 0 |
_aEncyclopaedia of measuring technology and mechartronics automation in electrical engineering _cContributors Satoshi Suzuki, Hideki Kakeya, Huaqing Wang, [et al.] _pv. 3 _nFault-Diagnosis applications: model-based condition |
|
| 260 |
_aLondon _bAuris Reference |
||
| 300 |
_ax, 261 p. _bill. _c25 cm. |
||
| 500 | _aEdition 2016 | ||
| 504 | _aBib and Ref | ||
| 650 | _aMetrology | ||
| 700 | _aHideki Kakeya | ||
| 700 | _aHuaqing Wang | ||
| 700 | _aAndre Chanzy | ||
| 942 | _cENGLISH | ||
| 999 |
_c487450 _d487450 |
||