000 01096nam a2200253Ia 4500
008 191130s1997##################000#0#eng##
020 _a9783908450276
022 _a99221384
040 _aACL
_cACL
082 _a537.622 CLA
245 _aProceedings of the 7th international autumn meeting gettering and defect engineering in semiconductor technology : GADEST '97, Spa, Belgium, October 5-10, 1997
_ceditors, and C. Claeys ... [et al.]
260 _aZurich ; Enfield, N.H
_bScitec Pub. Ltd. ; Trans Tech Pub. Ltd. [distributor]
_c[1997]
300 _axv, 538 p. : ill. ; 25 cm
500 _aIncludes bibliographical references and index
650 _aElectrical engineering - Materials - Congresses
650 _aGetters - Congresses
650 _aSemiconductors - Congresses
650 _aSilicon crystals - Defects - Congresses
700 _aClaeys, Cor L
710 _aInternational Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology" (7th : 1997 : Spa, Belgium)
990 _afd7c1154ac10000c0b8e6c11a43b619a
991 _a385740
999 _c44517
_d44517