| 000 | 00828nam a2200253Ia 4500 | ||
|---|---|---|---|
| 008 | 191130s1995##################000#0#eng## | ||
| 020 | _a9780306448584 | ||
| 022 | _a94045877 | ||
| 040 |
_aACL _cACL |
||
| 082 | _a543.08586 WIL | ||
| 245 |
_aX-ray spectrometry in electron beam instruments _cedited by David B. Williams, Joseph I. Goldstein, and Dale E. Newbury |
||
| 260 |
_aNew York _bPlenum Press _cc1995 |
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| 300 | _axviii, 372 p. : ill. ; 26 cm | ||
| 500 | _aIncludes bibliographical references and index | ||
| 650 | _aElectron beams - Instruments | ||
| 650 | _aElectron probe microanalysis | ||
| 650 | _aX-ray spectroscopy | ||
| 700 | _aGoldstein, Joseph | ||
| 700 | _aNewbury, Dale E | ||
| 700 | _aWilliams, David B | ||
| 990 | _a75a9cde3ac10000c702fb6fb029f2cb8 | ||
| 991 | _a188212 | ||
| 999 |
_c413560 _d413560 |
||