| 000 | 00864nam a2200241Ia 4500 | ||
|---|---|---|---|
| 008 | 191130s1996##################000#0#eng## | ||
| 020 | _a9054107405 | ||
| 040 |
_aACL _cACL |
||
| 082 | _a620.1127 KRI | ||
| 100 | _aKrihnadas Nair, C. G | ||
| 245 |
_aTrends in NDE science and technology: proceedings of the 14th world conference on non-destructive testing, New Delhi, 8-13 December 1996 _cC.G. Krishnadas Nair, Baldev Raj, C.R.L.Murthy , T.Jayakumar |
||
| 260 |
_aRotterdam _bA.A. Balkema _cc1996 |
||
| 300 | _av.4 (various pagination.) ; 25 cm | ||
| 500 | _aIncludes index | ||
| 650 | _aScinece technology - Proceedings | ||
| 700 | _aJayakumar, T | ||
| 700 | _aMurthy, C. R. L | ||
| 700 | _aRaji, Baldev | ||
| 710 | _aWorld Conference on Non-Destructive Testing | ||
| 990 | _a69cfd31dac10000c4187a17dad57edaa | ||
| 991 | _a94669 | ||
| 999 |
_c403102 _d403102 |
||