| 000 | 00744nam a2200229Ia 4500 | ||
|---|---|---|---|
| 008 | 191130s1991##################000#0#eng## | ||
| 020 | _a9780819406385 | ||
| 022 | _a91017832 | ||
| 040 |
_aACL _cACL |
||
| 082 | _a681.2 SIR | ||
| 245 |
_aSelected papers on speckle metrology _cRajpal S. Sirohi, editor |
||
| 260 |
_aBellingham, WA _bSPIE Optical Engineering Press _cc1991 |
||
| 300 | _axviii, 668 p. : ill. ; 28 cm | ||
| 500 | _aIncludes bibliographical references and index | ||
| 650 | _aHolographic interferometry | ||
| 650 | _aSpeckle metrology | ||
| 700 | _aSirohi, Rajpal S | ||
| 710 | _aSociety of Photo-optical Instrumentation Engineers | ||
| 990 | _a210f4241ac10000c57ab2eab43b34ef7 | ||
| 991 | _a276811 | ||
| 999 |
_c392320 _d392320 |
||