| 000 | 01186nam a2200265Ia 4500 | ||
|---|---|---|---|
| 008 | 191130s2002##################000#0#eng## | ||
| 020 | _a9780819445469 | ||
| 022 | _a2003535275 | ||
| 040 |
_aACL _cACL |
||
| 082 | _a621.36 DOP | ||
| 245 |
_aAdvanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA _cAngela Duparré, Bhanwar Singh, chairs/editors, ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.] |
||
| 260 |
_aBellingham, Wash _bSPIE _cc2002 |
||
| 300 | _aviii, 192 p. : ill. ; 28 cm | ||
| 500 | _aIncludes bibliographical references and index | ||
| 650 | _aInformation storage and retrieval systems - Congresses | ||
| 650 | _aMetrology - Congresses | ||
| 650 | _aOptical materials - Congresses | ||
| 650 | _aSemiconductors - Characterization - Congresses | ||
| 700 | _aDuparré, Angela | ||
| 700 | _aSingh, Bhanwar | ||
| 710 | _aBoeing Company, Society of Photo-optical Instrumentation Engineers | ||
| 990 | _afd595e29ac10000c6edb5ca32fe0168d | ||
| 991 | _a385546 | ||
| 999 |
_c362547 _d362547 |
||