| 000 | 01173nam a2200253Ia 4500 | ||
|---|---|---|---|
| 008 | 191130s2000##################000#0#eng## | ||
| 020 | _a9780819438935 | ||
| 022 | _a2001269021 | ||
| 040 |
_aACL _cACL |
||
| 082 | _a670.425 BEN | ||
| 245 |
_aProcess control and inspection for industry : 8-10 November 2000, Beijing, China _cShulian Zhang, Wei Gao, chairs/editors ; sponsored by COEMA--China Optics & Optoelectronic Manufacturer's Association, CPS--Chinese Physical Society, [and] SPIE--the International Society for Optical Engineering |
||
| 260 |
_aBellingham, WA _bSPIE _c2000 |
||
| 300 | _axx, 434 p. : ill. ; 28 cm | ||
| 500 | _aIncludes bibliographical references and index | ||
| 650 | _aDetectors - Industrial applications - Congresses | ||
| 650 | _aManufacturing processes - Automation - Congresses | ||
| 650 | _aProcess control - Automation - Congresses | ||
| 700 | _aGao, Wei | ||
| 700 | _aZhang, Shulian | ||
| 710 | _aChina Optics & Optoelectronic Manufacturers Association, Society of Photo-optical Instrumentation Engineers, Zhongguo wu li xue hui | ||
| 990 | _aea5e5667ac10000c76f0f8c57c7180a0 | ||
| 991 | _a377554 | ||
| 999 |
_c281333 _d281333 |
||