000			00833nam a2200217Ia 4500
008			191130s1999##################000#0#eng##
020			_a9780819432353
022			_a99032250
040			_aACL _cACL
082			_a681.25 AL
245			_aOptical metrology : proceedings of a conference held 18-19 July, 1999, Denver, Colorado _cGhanim A. Al-Jumaily, editor ; sponsored by SPIE - The International Society for Optical Engineering
260			_aBellingham, WA _bSPIE Optical Engineering Press _c1999
300			_avi, 276 p. : ill. ; 26 cm.
500			_aIncludes bibliographical references
650			_aOptical measurements - Congresses
700			_aAl-Jumaily, Ghanim A
710			_aSociety of Photo-optical Instrumentation Engineers
990			_a2576787bac10000c59ec37ed459edbb0
991			_a278612
999			_c27946 _d27946