| 000 | 01229nam a2200265Ia 4500 | ||
|---|---|---|---|
| 008 | 191130s2005##################000#0#eng## | ||
| 020 | _a9780819458568 | ||
| 022 | _a2005284363 | ||
| 040 |
_aACL _cACL |
||
| 082 | _a670.425 OST | ||
| 245 |
_aOptical measurement systems for industrial inspection IV : 13-17 June 2005, Munich, Germany _cWolfgang Osten, Christophe Gorecki, Erik Novak, chairs/editors ; sponsored by, SPIE Europe ; cooperating organizations, European Optical Society ; published by SPIE--the International Society for Optical Engineering |
||
| 260 |
_aBellingham, WA _bSPIE _cc2005 |
||
| 300 | _a2 v. (xviii, 1048 p. ) : ill. ; 28 cm. | ||
| 500 | _aIncludes bibliographical references and author index | ||
| 650 | _aOptical detectors - Industrial applications - Congresses | ||
| 650 | _aOptical instruments - Industrial applications - Congresses | ||
| 650 | _aQuality control - Optical methods - Congresses | ||
| 700 | _aGorecki, Christophe | ||
| 700 | _aNovak, Erik | ||
| 700 | _aOsten, Wolfgang | ||
| 710 | _aEuropean Optical Society, Society of Photo-optical Instrumentation Engineers, SPIE Europe | ||
| 990 | _aa62a3ddbac10000c244b7e75ccde0efc | ||
| 991 | _a340964 | ||
| 999 |
_c279347 _d279347 |
||