| 000 | 01121nam a2200241Ia 4500 | ||
|---|---|---|---|
| 008 | 191130s2009##################000#0#eng## | ||
| 020 | _a9780819476722 | ||
| 022 | _a2010459359 | ||
| 040 |
_aACL _cACL |
||
| 082 | _a670.425 LEH | ||
| 245 |
_aOptical measurement systems for industrial inspection VI : 15-18 June 2009, Munich, Germany _cPeter H. Lehmann, editor ; sponsored by SPIE Europe ; cooperating organizations, EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e. V. (Germany) |
||
| 260 |
_aBellingham, WA _bSPIE _c2009 |
||
| 300 | _a2 v. : ill. ; 28 cm. | ||
| 500 | _aIncludes bibliographical references and author index | ||
| 650 | _aOptical detectors - Industrial applications - Congresses | ||
| 650 | _aOptical instruments - Industrial applications - Congresses | ||
| 650 | _aQuality control - Optical methods - Congresses | ||
| 700 | _aLehmann, Peter H | ||
| 710 | _aEuropean Optical Society, SPIE (Society), SPIE Europe, Wissenschaftliche Gesellschaft Lasertechnik | ||
| 990 | _aa6f159fdac10000c0326a7a405d70868 | ||
| 991 | _a342048 | ||
| 999 |
_c27927 _d27927 |
||