| 000 | 01103nam a2200289Ia 4500 | ||
|---|---|---|---|
| 008 | 191130s2009##################000#0#eng## | ||
| 020 | _a9780819477224 | ||
| 022 | _a2010455650 | ||
| 040 |
_aACL _cACL |
||
| 082 | _a681.25 HUA | ||
| 245 |
_aOptical inspection and metrology for non-optics industries : 3-4 August 2009, San Diego, California, United States _cPeisen S. Huang, Toru Yoshizawa, Kevin G. Harding, editors ; sponsored and published by by SPIE |
||
| 260 |
_aBellingham, WA _bSPIE _cc2009 |
||
| 300 | _a1 v. (various pagings) : ill. ; 28 cm | ||
| 500 | _aIncludes bibliographical references and author index | ||
| 650 | _aEngineering inspection - Congresses | ||
| 650 | _aMetrology - Congresses | ||
| 650 | _aOptical measurements - Congresses | ||
| 650 | _aQuality control - Optical methods - Congresses | ||
| 650 | _aThree-dimensional display systems - Congresses | ||
| 700 | _aHarding, Kevin G | ||
| 700 | _aHuang, Peisen S | ||
| 700 | _aYoshizawa, Tōru | ||
| 710 | _aSPIE (Society) | ||
| 990 | _aab56c49bac10000c63c42b49992d20ff | ||
| 991 | _a343783 | ||
| 999 |
_c27899 _d27899 |
||