| 000 | 01030nam a2200265Ia 4500 | ||
|---|---|---|---|
| 008 | 191130s2005##################000#0#eng## | ||
| 020 | _a9780819458858 | ||
| 022 | _a2006281048 | ||
| 040 |
_aACL _cACL |
||
| 082 | _a535 HAN | ||
| 245 |
_aOptical diagnostics : 3-4 August, 2005, San Diego, California, USA _cLeonard M. Hanssen, Patrick V. Farrell, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering |
||
| 260 |
_aBellingham, WA _bSPIE _cc2005 |
||
| 300 | _a1 v. (various pagings) : ill. ; 28 cm. | ||
| 500 | _aIncludes bibliographical references and author index | ||
| 650 | _aMaterials - Testing - Congresses | ||
| 650 | _aOptical measurements - Congresses | ||
| 650 | _aReflectance - Congresses | ||
| 650 | _aRefractive index - Congresses | ||
| 700 | _aFarrell, Patrick V | ||
| 700 | _aHanssen, Leonard Matheus | ||
| 710 | _aSociety of Photo-optical Instrumentation Engineers | ||
| 990 | _af8118668ac10000c2991b94144fdc2c8 | ||
| 991 | _a382693 | ||
| 999 |
_c27827 _d27827 |
||