000 00632nam a2200205Ia 4500
008 191130s1999##################000#0#eng##
020 _a9780819433091
040 _aACL
_cACL
082 _a621.366 TIZ
100 _aTiziani, Hans J
245 _aLaser metrology and inspection : 14-15 June 1999, Munich, Germany
_cHans J.Tiziani
260 _aBellingham, WA
_bSPIE - Proceeding
_c1999
300 _avii,298 p. : ill. 28 cm
500 _aIncludes index
650 _aEngineering inspection
650 _aLasers--Industrial applications
990 _aef164ac2ac10000c5172abfdb3975009
991 _a379668
999 _c228821
_d228821