000 | 00632nam a2200205Ia 4500 | ||
---|---|---|---|
008 | 191130s1999##################000#0#eng## | ||
020 | _a9780819433091 | ||
040 |
_aACL _cACL |
||
082 | _a621.366 TIZ | ||
100 | _aTiziani, Hans J | ||
245 |
_aLaser metrology and inspection : 14-15 June 1999, Munich, Germany _cHans J.Tiziani |
||
260 |
_aBellingham, WA _bSPIE - Proceeding _c1999 |
||
300 | _avii,298 p. : ill. 28 cm | ||
500 | _aIncludes index | ||
650 | _aEngineering inspection | ||
650 | _aLasers--Industrial applications | ||
990 | _aef164ac2ac10000c5172abfdb3975009 | ||
991 | _a379668 | ||
999 |
_c228821 _d228821 |