000 00795nam a2200241Ia 4500
008 191130s1993##################000#0#eng##
020 _a9781560320036
022 _a92028181
040 _aACL
_cACL
082 _a530.41 BUS
245 _aIntense dynamic loading of condensed matter
_cA.V. Bushman ... [et al.] ; translated by S. Chomet ; English edition editor, J.W. Shaner
260 _aWashington DC
_bTaylor & Francis
_c1993
300 _ax, 287 p. : ill. ; 25 cm
500 _aIncludes bibliographical references (p. 263-281) and index
650 _aCondensed matter
650 _aMaterials - Dynamic testing
700 _aBushman, A. V
700 _aChomet, S
700 _aShaner, J. W
990 _a05a647fcac10000c01198abb09523581
991 _a262296
999 _c217010
_d217010