000 00729nam a2200241Ia 4500
008 191130s2001##################000#0#eng##
020 _a9780748409686
022 _a37716
040 _aACL
_cACL
082 _a502.825 GOO
100 _aGoodhew, Peter J
245 _aElectron microscopy and analysis
_cPeter J. Goodhew, John Humphreys, Richard Beanland
250 _a3rd ed
260 _aNew York
_bTaylor & Francis
_c2001
300 _ax, 251 p. : ill. ; 24 cm
500 _aIncludes bibliographical references (p. [236]-237) and index
650 _aElectron microscopy
700 _aBeanland, R
700 _aHumphreys, F. J
990 _a50910343ac10000c1a446578a4f54b1a
991 _a89559
999 _c158409
_d158409