000 | 00729nam a2200241Ia 4500 | ||
---|---|---|---|
008 | 191130s2001##################000#0#eng## | ||
020 | _a9780748409686 | ||
022 | _a37716 | ||
040 |
_aACL _cACL |
||
082 | _a502.825 GOO | ||
100 | _aGoodhew, Peter J | ||
245 |
_aElectron microscopy and analysis _cPeter J. Goodhew, John Humphreys, Richard Beanland |
||
250 | _a3rd ed | ||
260 |
_aNew York _bTaylor & Francis _c2001 |
||
300 | _ax, 251 p. : ill. ; 24 cm | ||
500 | _aIncludes bibliographical references (p. [236]-237) and index | ||
650 | _aElectron microscopy | ||
700 | _aBeanland, R | ||
700 | _aHumphreys, F. J | ||
990 | _a50910343ac10000c1a446578a4f54b1a | ||
991 | _a89559 | ||
999 |
_c158409 _d158409 |