| 000 | 00717nam a2200217Ia 4500 | ||
|---|---|---|---|
| 008 | 191130s2000##################000#0#eng## | ||
| 020 | _a9780792386698 | ||
| 022 | _a99046022 | ||
| 040 |
_aACL _cACL |
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| 082 | _a621.385 NAD | ||
| 245 |
_aDesign for at-speed test, diagnosis, and measurement _cedited by Benoit Nadeau-Dostie |
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| 260 |
_aBoston, MA _bKluwer Academic _cc2000 |
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| 300 | _axvii, 239 p. : ill. ; 26 cm | ||
| 500 | _aIncludes bibliographical references and index | ||
| 650 | _aElectronic apparatus and appliances - Testing | ||
| 650 | _aIntegrated circuits - Testing | ||
| 700 | _aNadeau-Dostie, Benoit | ||
| 990 | _a7b68a431ac10000c19bd030a6e59d8d4 | ||
| 991 | _a190871 | ||
| 999 |
_c147537 _d147537 |
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