000 | 00582nam a2200193Ia 4500 | ||
---|---|---|---|
008 | 191130s1993##################000#0#eng## | ||
020 | _a9780878496662 | ||
040 |
_aACL _cACL |
||
082 | _a621.38152 BAR | ||
245 |
_aDefects in semiconductors I : NCDS-1 _cEditor, Nickolay T Bagraev |
||
260 |
_aZug, Switzerland _bScitec Publications _c1993 |
||
650 | _aGitterbaufehler | ||
650 | _aHalbleiter | ||
650 | _aSemiconductors -- Defects -- Congresses | ||
700 | _aBagraev, Nickolay T | ||
990 | _a8ae5f8cdac10000c5fb8372bd23ffb05 | ||
991 | _a200123 | ||
999 |
_c146320 _d146320 |