000 00582nam a2200193Ia 4500
008 191130s1993##################000#0#eng##
020 _a9780878496662
040 _aACL
_cACL
082 _a621.38152 BAR
245 _aDefects in semiconductors I : NCDS-1
_cEditor, Nickolay T Bagraev
260 _aZug, Switzerland
_bScitec Publications
_c1993
650 _aGitterbaufehler
650 _aHalbleiter
650 _aSemiconductors -- Defects -- Congresses
700 _aBagraev, Nickolay T
990 _a8ae5f8cdac10000c5fb8372bd23ffb05
991 _a200123
999 _c146320
_d146320