| 000 | 00897nam a2200253Ia 4500 | ||
|---|---|---|---|
| 008 | 191130s2009##################000#0#eng## | ||
| 020 | _a9781420043761 | ||
| 022 | _a2008018722 | ||
| 040 |
_aACL _cACL |
||
| 082 | _a621.381 FLE | ||
| 245 |
_aDefects in microelectronic materials and devices _cedited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf |
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| 260 |
_aBoca Raton, FL _bCRC Press _c2009 |
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| 300 | _axvi, 753 p. : ill. ; 26 cm | ||
| 500 | _aIncludes bibliographical references and index | ||
| 650 | _aIntegrated circuits - Defects | ||
| 650 | _aMetal oxide semiconductor field-effect transistors - Testing | ||
| 650 | _aMicroelectronics - Materials - Testing | ||
| 700 | _aFleetwood, D. M | ||
| 700 | _aPantelides, Sokrates T | ||
| 700 | _aSchrimpf, Ronald Donald | ||
| 990 | _afb6d5103ac10000c41e9afde04992c08 | ||
| 991 | _a132640 | ||
| 999 |
_c146317 _d146317 |
||