| 000 | 00827nam a2200241Ia 4500 | ||
|---|---|---|---|
| 008 | 191130s1998##################000#0#eng## | ||
| 020 | _a9780306458965 | ||
| 022 | _a98041250 | ||
| 040 |
_aACL _cACL |
||
| 082 | _a620.44 CZA | ||
| 245 |
_aBeam effects, surface topography, and depth profiling in surface analysis _cedited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell |
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| 260 |
_aNew York _bPlenum Press _cc1998 |
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| 300 | _axix, 430 p. : ill. ; 24 cm. | ||
| 500 | _aIncludes bibliographical references and index | ||
| 650 | _aMaterials - Effect of radiation on | ||
| 650 | _aSurfaces (Technology) - Analysis | ||
| 700 | _aCzanderna, Alvin Warren | ||
| 700 | _aMadey, Theodore E | ||
| 700 | _aPowell, C. J | ||
| 990 | _aa7b5f796ac10000c66592f4ecb15b7b2 | ||
| 991 | _a107307 | ||
| 999 |
_c112672 _d112672 |
||