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1.
Power-constrained testing of VLSI circuits by Nicola Nicolici and Bashir M. Al-Hashimi by
Publication details: Boston Kluwer Academic Publishers 2003
Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.3950287 NIC.

2.
Electrothermal analysis of VLSI systems Yi-Kan Cheng ... [et al.] by
Publication details: Boston Kluwer Academic Publishers 2000
Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.395 CHE.

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