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Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA Angela Duparré, Bhanwar Singh, chairs/editors, ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.] by
Publication details: Bellingham, Wash SPIE c2002
Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.36 DOP.
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Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA Angela Duparré, Bhanwar Singh, Zu-Han Gu, editors, ; sponsored and published by SPIE by
Publication details: Bellingham, Wash SPIE c2007
Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381045 DUP.
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