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Results of search for 'su:"Scanning electron microscopes"'
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Authors
Chui, Benjamin W
Randle, V
Item types
English Books
Topics
Alloys - Microscopy
Grain boundaries
Metallography
Optical storage devi...
Scanning electron mi...
Your search returned 2 results.
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1.
Microcantilevers for atomic force microscope data storage
by Benjamin W. Chui
by
Chui, Benjamin W
Publication details:
Dordrecht ; Boston
Kluwer Academic Publishers
1998
Availability:
Items available for loan:
Anna Centenary Library
(1)
Call number:
621.39767 CHU
.
2.
The measurement of grain boundary geometry
V Randle
by
Randle, V
Edition:
1st ed
Publication details:
Bristol
Institute of Physics Pub
1993
Availability:
Items available for loan:
Anna Centenary Library
(1)
Call number:
620.1699 RAN
.
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