Results
|
1.
|
|
|
|
2.
|
|
|
|
3.
|
|
|
|
4.
|
|
|
|
5.
|
|
|
|
6.
|
|
|
|
7.
|
|
|
|
8.
|
|
|
|
9.
|
|
|
|
10.
|
|
|
|
11.
|
|
|
|
12.
|
|
|
|
13.
|
|
|
|
14.
|
|
|
|
15.
|
|
|
|
16.
|
|
|
|
17.
|
|
|
|
18.
|
|
|
|
19.
|
|
|
|
20.
|
|
|
|
21.
|
|
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany Angela Duparré, Roland Geyl, Lingli Wang, chairs/editors ; sponsored by SPIE Europe ; cosponsored by Friedrich-Schiller-Universität Jena (Germany) ; cooperating organizations, EOS--European Optical Society, DGaO--Deutsche Gesellschaft für Angewandte Optik e. V. (Germany), Optonet e. V. (Germany) by
Publication details: Bellingham, WA SPIE c2005
Availability: Items available for loan: Anna Centenary Library (1)Call number: 681.4 DUP.
|
|
22.
|
|
|
|
23.
|
|
|
|
24.
|
|
|
|
25.
|
|
|
|
26.
|
|
|
|
27.
|
|
|
|
28.
|
|
|
|
29.
|
|
|
|
30.
|
|
|
|
31.
|
|
|
|
32.
|
|
|
|
33.
|
|
|
|
34.
|
|
|
|
35.
|
|
|
|
36.
|
|
|
|
37.
|
|
|
|
38.
|
|
|
|
39.
|
|
|
|
40.
|
|
|
|
41.
|
|
|
|
42.
|
|
|
|
43.
|
|
|
|
44.
|
|
|
|
45.
|
|
|
|
46.
|
|
|
|
47.
|
|
|
|
48.
|
|
|
|
49.
|
|
|
|
50.
|
|
|
|
51.
|
|
|
|
52.
|
|
|
|
53.
|
|
|
|
54.
|
|
|
|
55.
|
|
|
|
56.
|
|
|
|
57.
|
|
|
|
58.
|
|
Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA Angela Duparré, Bhanwar Singh, chairs/editors, ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.] by
Publication details: Bellingham, Wash SPIE c2002
Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.36 DOP.
|
|
59.
|
|
|
|
60.
|
|
|