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	1.		Microelectronic materials C R M Grovenor by Grovenor, C. R. M Publication details: New York Taylor & Francis 1998 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 GRO.
	2.		Microelectronics processing : inorganic materials characterization Lawrence A. Casper by Casper, L. A American Chemical Society. Division of Industrial and Engineering Chemistry Publication details: Washington, DC American Chemical Society 1986 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 CAS.
	3.		Polymeric materials for microelectronic applications : science and technology Hiroshi Ito, editor, Seiichi Tagawa, editor, Kazuyuki Horie, editor by Horie, Kazuyuki Ito, Hiroshi Tagawa, Seichi American Chemical Society. Division of Polymeric Materials: Science and Engineering, Kōbunshi Gakkai (Japan). Polymers for Microelectronics and Photonics Group Publication details: Washington, DC American Chemical Society 1994 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 ITO.
	4.		Polymers for microelectronics : resists and dielectrics Larry F. Thompson, editor, C. Grant Willson, editor, Seiichi Tagawa, editor by Tagawa, Seiichi Thompson, L. F Willson, C. G American Chemical Society. Division of Polymeric Materials: Science and Engineering, American Chemical Society. Meeting (203rd : 1992 : San Francisco, Calif.) Publication details: Washington, DC American Chemical Society 1994 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381531 THO.
	5.		Polymers for microelectronics and nanolectronics Qinghuang Lin, editor ; Raymond A. Pearson, editor ; Jeffrey C. Hedrick, editor by Hedrick, Jeffrey C Lin, Qinghuang Pearson, R. A Publication details: Washington, DC American Chemical Society c2004 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 LIN.
	6.		Process and equipment control in microelectronic manufacturing : 19-20 may, 1999, Edinburgh, Scotland Kevin Yallup, Murali K. Narasimhan, chairs/editors by Narasimhan, Murali K Yallup, Kevin European Commission. Directorate-General XII, Science, Research, and Development, European Optical Society, Society of Photo-optical Instrumentation Engineers Publication details: Bellingham, WA SPIE 1999 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 YAL.
	7.		Process and equipment control in microelectronic manufacturing II : 30-31 may 2001, Edinburgh, UK Martin Fallon, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by Scottish Enterprise (UK) ; cooperating organizations EOS--European Optical Society, IEE--the Institution of Electrical Engineers (UK) by Fallon, Martin European Optical Society, Institution of Electrical Engineers, Scottish Enterprise, Society of Photo-optical Instrumentation Engineers Publication details: Bellingham, WA SPIE c2001 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 FAL.
	8.		Thermoelectrics handbook : macro to nano edited by D. M. Rowe by Rowe, D. M Publication details: Boca Raton, FL CRC Press, Taylor & Francis Group 2006 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.31243 ROW.
	9.		Carbon-based materials for microelectronics : proceedings of symposium K on carbon-based materials for Microelectronics of the E-mRS 1998 spring conference, Strasbourg, France, June 16-19, 1998 edited by J. Robertson, J. Fink and E. Kohn by Fink, J Kohn, E Robertson, J European Materials Research Society. Meeting (1998 : Strasbourg, France), Symposium K on Carbon-based Materials for Microelectronics (1998 : Strasbourg, France) Publication details: Amsterdam Elsevier 1999 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 ROB.
	10.		Defects in microelectronic materials and devices edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf by Fleetwood, D. M Pantelides, Sokrates T Schrimpf, Ronald Donald Publication details: Boca Raton, FL CRC Press 2009 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 FLE.
	11.		Dielectric films for advanced microelectronics edited by Mikhail Baklanov, Martin Green, and Karen Maex by Baklanov, Mikhail Green, Martin Maex, Karen Publication details: Chicester, West Sussex John Wiley & Sons c2007 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 BAK.
	12.		Influence of temperature on microelectronics and system reliability Pradeep Lall, Michael G. Pecht, Edward B. Hakim by Lall, Pradeep Hakim, Edward B Pecht, Michael Publication details: Boca Raton, FL CRC Press c1997 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381046 LAL.
	13.		In-line characterization, yield reliability, and failure analyses in microelectronic manufacturing : 19-21 May, 1999, Edinburgh, Scotland Kostas Amberiadis ... [et al.], chairs/editors ; sponsored by EOS--European Optical Society, SPIE--the International Society for Optical Engineering, [and] Commission of the European Communities, Directorate General for Science, Research, and Development ; cosponsored by Scottish Enterprise [and] Sira Technology Centre (UK) ; cooperating organization, IEE--the Institution of Electrical Engineers by Amberiadis, Kostas European Commission. Directorate-General XII, Science, Research, and Development, European Optical Society, Institution of Electrical Engineers, Scottish Enterprise, Sira Technology Centre (U.K.), Society of Photo-optical Instrumentation Engineers Publication details: Bellingham, WA SPIE c1999 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.3815 AMB.
	14.		In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK Gudrun Kissinger, Larg H. Weiland, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by Scottish Enterprise (UK) ; cooperating organizations EOS--European Optical Society, IEE--the Institution of Electrical Engineers (UK) by Kissinger, Gudrun Weiland, Larg H European Optical Society, Institution of Electrical Engineers, Scottish Enterprise, Society of Photo-optical Instrumentation Engineers Publication details: Bellingham, WA SPIE c2001 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 KIS.
	15.		International conference on optical diagnosis of materials and devices for opto-, micro-, and quantum electronics : 13-15 may 1997, Kiev, Ukraine Sergei V. Svechnikov, Mikhail Ya. Valakh, chairs/editors ; organized by SPIE Ukraine Chapter ... [et al.] ; sponsored by Physical Society of Ukraine, Relcom (Ukraine), [and] Dynamic Ltd. Company (Ukraine) by Svechnikov, Sergei Vasilevich Valakh, M. I︠A︡ International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics (1997 : Kiev, Ukraine), Society of Photo-optical Instrumentation Engineers, SPIE Ukraine Chapter, Ukrainian Physical Society Publication details: Bellingham, WA SPIE c1998 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 SVE.
	16.		Advanced materials for interconnections : proceedings of symposium J on advanced materials for Interconnections of the 1996 E-MRS spring conference, Strasbourg, France, June 4-7,1996 edited by T. Gessner, J. Torres, G. Crean by Crean, G Gessner, T Torres, J European Materials Research Society. Meeting (1996 : Strasbourg, France), Symposium J on Advanced Materials for Interconnections (1996 : Strasbourg, France) Publication details: Amsterdam Elsevier 1997 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 GES.

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