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	1.		Microelectronic yield, reliability, and advanced packaging : 28-30 November 2000, Singapore Cher Ming Tan ... [et al.], chairs/editors ; sponsored by Nanyang Technological University (Singapore) [and] SPIE--the International Society for Optical Engineering ; cooperating organizations, Institute of Physics (Singapore) ... [et al.] by Tan, Cher Ming Institute of Physics, Singapore, Nanyang Technological University, Society of Photo-optical Instrumentation Engineers Publication details: Bellingham, WA SPIE c2000 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 TAN.
	2.		Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport beach, USA Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering by Baaklini, George Y Meyendorf, Norbert Michel, Bernd Society of Photo-optical Instrumentation Engineers Publication details: Bellingham, WA SPIE 2002 Availability: Items available for loan: Anna Centenary Library (1)Call number: 620.5 MEY.

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