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Mastering ACLS
Edition: 2nd ed
Publication details: Philadelphia, PA Lippincott Williams & Wilkins 2006
Availability: Items available for loan: Anna Centenary Library (1)Call number: 616.1025 LIP.
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Metrology, inspection, and process control for microlithography XVII : 24-27 February, 2003, Santa Clara, California, USA Daniel J. Herr, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International ; International SEMATECH by
Publication details: Bellingham, WA SPIE c2003
Availability: Items available for loan: Anna Centenary Library (2)Call number: 621.381531 HER, ...
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Metrology, inspection, and process control for microlithography XXII : 25-28 February 2008, San Jose, California, USA John A. Allgair, Christopher J. Raymond, editors ; sponsored and published by SPIE ; cooperating organization, SEMATECH (USA) by
Publication details: Bellingham, WA SPIE 2008
Availability: Items available for loan: Anna Centenary Library (2)Call number: 539.752 ALL, ...
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Most work measurement systems Kjell B. Zandin by
Edition: 3rd ed., rev. and expanded
Publication details: New York Marcel Dekker 2003
Availability: Items available for loan: Anna Centenary Library (1)Call number: 658.542 ZAN.
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Optical test and measurement technology and equipment : 4th international symposium on advanced Optical manufacturing and testing technologies : 19-21 November 2008, Chengdu, China Yudong Zhang... [et al. ], editors ; sponsored by COS--the Chinese Optical Society (China) [and] IOE--the Institute of Optics and Electronics, CAS (China) ; technical cosponsor, SPIE ; cosponsoring organizations, State Key Laboratory of Optical Technology for Microfabrication (China) [and] SOS--Sichuan Optical Society (China) ; cooperating organization, Committee of Optical Manufacturing Technology, COS (China) ; supporting organizations, Ministry of Science and Technology of China (China), Chinese Academy by
- Zhang, Yudong
- China. Guo jia ke xue ji shu bu, Guo jia zi ran ke xue ji jin wei yuan hui (China), International Symposium on Advanced Optical Manufacturing and Testing Technologies (4th : 2008 : Chengdu, China), Sichuan Optical Society, SPIE (Society), State Key Laboratory of Optical Technology for Microfabrication (China), Zhongguo guang xue xue hui, Zhongguo guang xue xue hui. Committee of Optical Manufacturing Technology, Zhongguo ke xue yuan, Zhongguo ke xue yuan. Institute of Optics and Electronics
Publication details: Bellingham, WA SPIE c2009
Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.382750287 ZHA.
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Water and wastewater Krishna Gopal by
Publication details: New Delhi A.P.H Publishing Corporation 2007
Availability: Items available for loan: Anna Centenary Library (1)Call number: 363.7394 KRI.
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Dimensional metrology Connie Dotson by
Publication details: Australia Cengage Learning c2007
Availability: Items available for loan: Anna Centenary Library (1)Call number: 530.8 DOT.
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Eighth international symposium on laser metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico R. Rodriguez-Vera, F. Mendoza-Santoyo, editors ; co-organized by, CIO--Centro de Investigaciones en Óptica, A.C. (Mexico), IMEKO TC-14--International Measurement Confederation, Technical Committee on Measurement of Geometrical Quantities ; sponsored by, SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical Engineering by
Publication details: Bellingham, WA SPIE c2005
Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.366 VER.
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Electro-diffusion of ions Isaak Rubinstein by
Publication details: Philadelphia, PA Society for Industrial and Applied Mathematics 1990
Availability: Items available for loan: Anna Centenary Library (1)Call number: 541.372 RUB.
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