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	1.		From contamination to defects, faults, and yield loss : simulation and applications by Jitendra B. Khare, Wojciech Maly by Khare, Jitendra B Maly, W Publication details: Dordrecht ; Boston Kluwer Academic Publishers c1996 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381520685 KHA.
	2.		High-speed VLSI interconnections Ashok K. Goel by Goel, Ashok K Edition: 2nd ed Publication details: New Delhi IEEE Press, Wiley-Interscience 2015 reprint Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.395 GOE.
	3.		A priori wire length estimates for digital design Dirk Stroobandt by Stroobandt, Dirk Publication details: Deventer, The Netherlands ; Boston, MA Kluwer Academic Publishers 2001 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.38152 STR.

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