Electronics reliability and measurement technology : nondestructive evaluation edited by Joseph S. Heyman

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Publication details: Park Ridge, N.J Noyes Data Corp 1988Description: xii, 128 p. : ill. ; 27 cmISBN:

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Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.3810287 HEY (Browse shelf(Opens below))	Available		330256

Includes bibliographical reference and index

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