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1.
Yield and variability optimization of integrated circuits J.C. Zhang, M.A. Styblinski by
Publication details: Dordrecht ; Boston Kluwer Academic Publishers 1995
Availability: Items available for loan: Anna Centenary Library (1)Call number: 623815 ZHA.

2.
Defects in microelectronic materials and devices edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf by
Publication details: Boca Raton, FL CRC Press 2009
Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381 FLE.

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High-speed VLSI interconnections Ashok K. Goel by
Edition: 2nd ed
Publication details: New Delhi IEEE Press, Wiley-Interscience 2015 reprint
Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.395 GOE.

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