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	1.		Mathematical modeling, Bayesian estimation, and inverse problems : 21-23 July 1999, Denver, Colorado Françoise Prêteux, Ali Mohammad-Djafari, Edward R. Dougherty, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organization, SIAM--Society for Industrial and Applied Mathematics by Dougherty, Edward R Mohammad-Djafari, Ali Prêteux, Françoise Society for Industrial and Applied Mathematics, Society of Photo-optical Instrumentation Engineers Publication details: Bellingham, WA SPIE c1999 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.3670727 PRE.
	2.		Pattern recognition and image analysis Earl Gose, Richard Johnsonbaugh, Steve Jost by Gose, Earl Johnsonbaugh, Richard Jost, Steve Publication details: New Delhi PHI c1996 Availability: Items available for loan: Anna Centenary Library (1)Call number: 006.4 GOS.
	3.		Analysis and evaluation of sampled imaging systems Richard H. Vollmerhausen, Donald A. Reago, Jr., Ronald G. Driggers by Vollmerhausen, Richard H Driggers, Ronald G Reago, Donald Publication details: Bellingham, Wash SPIE Press 2010 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.367 VOL.

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