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Results of search for 'ccl=su:"Nanostructured materials - Testing - Congresses"'
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Authors
Andrews, David L
Baaklini, George Y
Meyendorf, Norbert
Michel, Bernd
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English Books
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Light - Scattering -...
Microelectromechanic...
Microelectromechanic...
Nanostructured mater...
Near-field microscop...
Nondestructive testi...
Optical materials - ...
Optoelectronic devic...
Quality control - Co...
Raman spectroscopy -...
Surfaces (Technology...
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1.
Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport beach, USA
Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
by
Baaklini, George Y
Meyendorf, Norbert
Michel, Bernd
Society of Photo-optical Instrumentation Engineers
Publication details:
Bellingham, WA
SPIE
2002
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Items available for loan:
Anna Centenary Library
(1)
Call number:
620.5 MEY
.
2.
Optical devices and diagnostics in materials science : 1-4 August 2000, San Diego, USA
David L. Andrews... [et al. ] ; sponsored... by SPIE--the International Society for Optical Engineering
by
Andrews, David L
Society of Photo-optical Instrumentation Engineers
Publication details:
Bellingham, WA
SPIE
2000
Availability:
Items available for loan:
Anna Centenary Library
(1)
Call number:
620.110287 AND
.
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