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1.
Yield and variability optimization of integrated circuits J.C. Zhang, M.A. Styblinski by
Publication details: Dordrecht ; Boston Kluwer Academic Publishers 1995
Availability: Items available for loan: Anna Centenary Library (1)Call number: 623815 ZHA.

2.
Electronics reliability and measurement technology : nondestructive evaluation edited by Joseph S. Heyman by
Publication details: Park Ridge, N.J Noyes Data Corp 1988
Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.3810287 HEY.

3.
Guidebook for managing silicon chip reliability Michael G. Pecht, Riko Radojcic, Gopal Rao by
Publication details: Boca Raton, FL CRC Press 1999
Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.3815 PEC.

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