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Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-26[sic], January, 2000, San Jose, California Geoffrey T. Burnham ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering by
Publication details: Bellingham, WA SPIE 2000
Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.366 BUR.
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