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	1.		No cover image available Random testing of digital circuits : theory and applications René David by David, René Publication details: New York Marcel Dekker 1998 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.3815 DAV.
	2.		CTL for test information of digital ICs by Rohit Kapur by Kapur, Rohit Publication details: Boston Kluwer Academic Publishers 2003 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381548 KAP.
	3.		Digital integrated circuits : design-for-test using Simulink and Stateflow Evgeni Perelroyzen by Perelroyzen, Evgeni Publication details: Boca Raton, FL CRC Press 2007 Availability: Items available for loan: Anna Centenary Library (1)Call number: 62 3815 PER.
	4.		Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits Michael L. Bushnell, Vishwani D. Agrawal by Bushnell, Michael L Agrawal, Vishwani D Publication details: Boston Springer 2000 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.395 BUS.
	5.		Introduction to IDDQ testing by Sreejit Chakravarty and Paul J. Thadikaran by Chakravarty, Sreejit Thadikaran, Paul J Publication details: Dorcrecht ; Boston Kluwer Academic Publishers 1997 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.381548 CHA.
	6.		A unified approach for timing verification and delay fault testing Mukund Sivaraman and Andrzej J. Strojwas by Sivaraman, Mukund Strojwas, Andrzej J Publication details: Boston Kluwer Academic 1998 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.3950287 SIV.

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