Defect-oriented testing for Nano - Metric CMOS VLSI circuits Manoj Sachdev and Jose Pineda de Gyvez

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Publication details: Berlin Springer 2010Description: xx, 328p. : illISBN:

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Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.395 SAC (Browse shelf(Opens below))	Available		325059

Includes index

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