Machine vision applications in industrial inspection XI : 22-24 January, 2003, Santa Clara, California, USA Martin A. Hunt, Jeffery R. Price, chairs/editors ; sponsored and published by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

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Publication details: Bellingham, WA SPIE c2003Description: vii, 324 p. : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	629 HUN (Browse shelf(Opens below))	Available		424022

Includes bibliographical references and author index

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