Optical measurement systems for industrial inspection VI : 15-18 June 2009, Munich, Germany Peter H. Lehmann, editor ; sponsored by SPIE Europe ; cooperating organizations, EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e. V. (Germany)

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Publication details: Bellingham, WA SPIE 2009Description: 2 v. : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	670.425 LEH (Browse shelf(Opens below))	Available		423050
Anna Centenary Library	670.425 LEH (Browse shelf(Opens below))	Available		423051

Includes bibliographical references and author index

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