Delay fault testing for VLSI circuits Angela Krstić, Kwang-Ting (Tim) Cheng

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Publication details: Dordrecht ; Boston Kluwer Academic Publishers 1998Description: xii, 191 p. : ill. ; 24 cmISBN:

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Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.381548 KRS (Browse shelf(Opens below))	Available		263674

Includes bibliographical references (p. [173]-188) and index

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