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	1.		Beam injection assessment of defects in semiconductors : proceedings of the 5th international workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS 98), held in Park hotel Schloss Wulkow near Berlin, Germany, August 30-september 3, 1998 editors, M. Kittler...[et al.] by Breitenstein, O Endros, A Kittler, M Publication details: Hampshire, USA Scitec Publications 1998 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.38152 KIT.
	2.		Gettering and defect engineering in semiconductor technology : GADEST '91 : proceedings of the 4th international autumn meeting held in Chossewitz, near Frankfurt (Oder), Germany, October 13-19 1991 edited by M. Kittler and H. Richter by Kittler, M Richter, H Publication details: Vaduz Sci-Tech Publications Ltd 1991 Availability: Items available for loan: Anna Centenary Library (1)Call number: 531.7 KIT.
	3.		Gettering and defect engineering in semiconductor technology XII : Gadest 2007 : proceedings of the 12th international autumn meeting, EMFCSC, Erice, Italy, October 14-19, 2007 edited by A. Cavallini . . . [et al. ] by Cavallini, A Kittler, M Pizzini, S International Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology" (12th : 2007 : Erice, Italy) Publication details: Zurich, Switerland Trans Tech Publications 2008 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.38152 CAV.
	4.		Gettering and defect engineering in semiconductor technology: Gadest '95 : held in Parkhotel Schloss Wulkow, near Berlin, Germany, September 02-07, 1995 edited by M Kittler, H Richter and Cor L Claeys by Claeys, Cor L Kittler, M Richter, H Publication details: Uetikon-Zuerich, Switzerland Scitec Publications 1995 Availability: Items available for loan: Anna Centenary Library (1)Call number: 621.38152 KIT.

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