From contamination to defects, faults, and yield loss : simulation and applications by Jitendra B. Khare, Wojciech Maly

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Publication details: Dordrecht ; Boston Kluwer Academic Publishers c1996Description: 150 p. : ill. ; 24 cmISBN:

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Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.381520685 KHA (Browse shelf(Opens below))	Available		317756

Includes bibliographical references and index

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