High resolution x-ray diffractometry and topography D. Keith Bowen and Brian K. Tanner

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Publication details: London Taylor & Francis c1998Description: x, 252 p. : ill. ; 28 cmISBN:

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Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	548.83 TAN (Browse shelf(Opens below))	Available		176932

Includes bibliographical references and index

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