CTL for test information of digital ICs by Rohit Kapur

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Publication details: Boston Kluwer Academic Publishers 2003Description: ix, 173 p. : ill. ; 24 cmISBN:

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Item type: Books

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Holdings
Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.381548 KAP (Browse shelf(Opens below))	Available		317617

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