Reliability, Packaging, Testing, And Characterization Of Mems/moems Vi : 23-24 January, 2007, San Jose, California, Usa / edited by Allyson L. Hartzell, Rajeshuni Ramesham

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Language: English Series: Proceedings of SPIE--the International Society for Optical Engineering ; v. 6463Publication details: Bellingham Spie c2007Edition: 1st edDescription: ix, (various pagings) : ill. ; 29 cmISBN:

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Holdings
Item type	Current library	Call number	Status	Barcode
Reference	Anna Centenary Library 6TH FLOOR, B WING	621.381 HAR (Browse shelf(Opens below))	Not for loan	278140

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