Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland

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Publication details: New York Taylor & Francis 2001Edition: 3rd edDescription: x, 251 p. : ill. ; 24 cmISBN:

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Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	502.825 GOO (Browse shelf(Opens below))	Available		288867

Includes bibliographical references (p. [236]-237) and index

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