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	1.		Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA Kevin G. Harding, John W.V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering by Batchelor, Bruce G Harding, Kevin G Miller, John W. V Society of Photo-optical Instrumentation Engineers Publication details: Bellingham, WA SPIE 2001 Availability: Items available for loan: Anna Centenary Library (1)Call number: 681.25 HAR.
	2.		Machine vision for the inspection of natural products Mark Graves and Bruce Batchelor (eds.) by Graves, Mark Batchelor, Bruce G Publication details: Berlin Springer c2003 Availability: Items available for loan: Anna Centenary Library (1)Call number: 670.425 GRA.
	3.		Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts John W.V. Miller, Susan Snell Solomon, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering by Batchelor, Bruce G Miller, John W. V Solomon, Susan Snell Society of Photo-optical Instrumentation Engineers Publication details: Bellingham, WA SPIE c1999 Availability: Items available for loan: Anna Centenary Library (1)Call number: 670.425 MIL.
	4.		Intelligent machine vision : techniques, implementations, and applications Bruce Batchelor and Frederick Waltz by Batchelor, Bruce G Waltz, Frederick M Publication details: Berlin ; New York Springer c2001 Availability: Items available for loan: Anna Centenary Library (1)Call number: 006.37 BAT.
	5.		Intelligent vision systems for industry Bruce G. Batchelor and Paul F. Whelan by Batchelor, Bruce G Whelan, Paul F Publication details: Berlin ; New York Springer c1997 Availability: Items available for loan: Anna Centenary Library (1)Call number: 670.4272637 BAT.

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